RT Book, Whole SR Electronic DC OPAC T1 1998 IEEE Autotestcon proceedings : [Autotestcon '98] : IEEE Systems Readiness Technology Conference : Test technology for the 21st Century : [24-27 August, 1998, Salt Lake City, Utah A1 Autotestcon FD 1998 K1 Mechanical Engineering - General PB IEEE SN 9780780344204 NO 書誌ID=EB00001063; LK [E Book]https://ieeexplore.ieee.org/servlet/opac?punumber=5779; [E Book]https://ieeexplore.ieee.org/servlet/opac?punumber=5779